Altmetric: now covering patents

Tracking patent citations is one important way to understand the economic impacts of scholarship.

 

Altmetric are now indexing citations to research found in 8 million patents from nine jurisdictions worldwide, including World Intellectual Property Organization, United States Patent and Trademark Office, and the European Patent Office.

 

You can now use patent citation data to:

  • find examples of the commercialisation of research
  • visualise the economic impacts of research over time
  • export patent citations for use in reports and presentations

 

Altmetric are offering a half-hour webinar:

Introduction to Altmetric’s newest data source, patent citations

April 24th 2018 at 3 pm

 

About Altmetric

Altmetric is a tool that tracks social media and news attention to research papers and other publications. For more information see: http://libguides.stir.ac.uk/altmetric

To access Altmetric for Institutions:

 

 

Clare Allan

Senior Research Librarian